Spectroscopy
Discover our Capabilities
NMR
High-resolution NMR (Nuclear Magnetic Resonance) spectroscopy is a method for detailed structural elucidation of organic substances. For this, samples are placed in a strong magnetic field and irradiated with radiofrequency pulses. The change in the magnetization of the elements (e.g., hydrogen and carbon) is observed depending on their chemical environment.
The obtained spectra provide information on functional groups, compound classes, ratios of individual molecular parts to each other, structural isomerism, and even the complete structure of compounds.
Applications
- Quantification of Organic Components in Mixtures
- Polymer Characterization
- Incoming Goods Inspection
- Competitive Analysis
Molecular Spectroscopy
In molecular spectroscopy (IR/Raman/UV-Vis), absorption or scattering of incident light occurs. This is characteristic of specific molecular fragments.
The recorded spectra show specific bands for certain molecular components, allowing for the identification of organic materials in particular.
Applications
- Analysis of Plastic Components
- Polymer Characterization
- Failure Analysis
- Stains and Contaminants
- Analysis of Competitor Products
X-ray Fluorescence Analysis
The X-ray fluorescence spectrometer (XRF) provides the elemental composition of a sample and allows for the detection of many elements in trace concentrations.
The method is suitable for both solid and liquid samples.
Applications
- Trace Analysis
- Verification of Materials for RoHS Compliance (Restriction of Hazardous Substances)
Spectroscopy
Atomic Emission Spectroscopy (ICP-OES) enables elemental analysis in aqueous solutions through optical emission spectroscopy with inductively coupled plasma (argon).
The plasma at 10,000 K atomizes and ionizes the analyzed compounds, making them energy-rich. Upon returning to the ground state, the absorbed energy is emitted as specific light. The evaluation of ion lines offers high interference immunity, improved precision, and lower detection limits. Today, simultaneous analysis of up to 70 elements is possible.
Applications
- Metal Analysis
- Environmental Analysis
Electron Microscopy
The scanning electron microscope (SEM) is a device for imaging surface structures. It provides images with high resolution and depth of field.Additionally, the distribution of various materials can be visualized.Furthermore, the local elemental composition of different sample areas can be analyzed using energy-dispersive X-ray spectroscopy (EDX).Applications- Structure and Composition of Components
- Failure Analysis
- Stains and Contaminants
- Analysis of Competitor Products
Surface Analysis (ESCA)
Electron Spectroscopy for Chemical Analysis (also XPS) analyzes (semi-quantitatively) the elemental composition of the uppermost nanometers (10-15 atomic layers) of solids.
The method also provides information on the bonding states of the elements. Sputtering off the layers allows for the measurement of the depth distribution of elements (depth profile).
Applications
- Adhesion
- Wetting Problems
- Coating Delamination
- Surface and Interface Characterization
- Corrosion Protection
- Reactivity of Catalysts