{"id":37303,"date":"2025-04-08T14:13:31","date_gmt":"2025-04-08T14:13:31","guid":{"rendered":"https:\/\/aso-labor.de\/methoden\/surface-analysis-and-microscopy\/"},"modified":"2026-01-26T00:17:17","modified_gmt":"2026-01-26T00:17:17","slug":"oberflaechenanalytik-und-mikroskopie","status":"publish","type":"methoden","link":"https:\/\/aso-labor.de\/en\/methods\/oberflaechenanalytik-und-mikroskopie\/","title":{"rendered":"Surface Analysis and Microscopy"},"content":{"rendered":"\t\t<div data-elementor-type=\"wp-post\" data-elementor-id=\"37303\" class=\"elementor elementor-37303 elementor-34928\" data-elementor-post-type=\"methoden\">\n\t\t\t\t<div class=\"elementor-element elementor-element-fb766c8 e-con-full e-flex cmsmasters-block-default e-con e-child\" data-id=\"fb766c8\" data-element_type=\"container\" data-e-type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-7a52cd5 cmsmasters-block-default cmsmasters-sticky-default elementor-widget elementor-widget-heading\" data-id=\"7a52cd5\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t\t<h1 class=\"elementor-heading-title elementor-size-default\">Surface Analysis and Microscopy<\/h1>\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-237cc54 cmsmasters-block-default cmsmasters-sticky-default elementor-widget elementor-widget-image\" data-id=\"237cc54\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"1024\" height=\"683\" src=\"https:\/\/aso-labor.de\/wp-content\/uploads\/2025\/03\/IR-2-Physik-1024x683.jpg\" class=\"attachment-large size-large wp-image-37304\" alt=\"REM Aufnahme - Elektronenmikroskopie ASO\" srcset=\"https:\/\/aso-labor.de\/wp-content\/uploads\/2025\/03\/IR-2-Physik-1024x683.jpg 1024w, https:\/\/aso-labor.de\/wp-content\/uploads\/2025\/03\/IR-2-Physik-300x200.jpg 300w, https:\/\/aso-labor.de\/wp-content\/uploads\/2025\/03\/IR-2-Physik-768x512.jpg 768w, https:\/\/aso-labor.de\/wp-content\/uploads\/2025\/03\/IR-2-Physik-1536x1024.jpg 1536w, https:\/\/aso-labor.de\/wp-content\/uploads\/2025\/03\/IR-2-Physik-2048x1365.jpg 2048w, https:\/\/aso-labor.de\/wp-content\/uploads\/2025\/03\/IR-2-Physik-450x300.jpg 450w, https:\/\/aso-labor.de\/wp-content\/uploads\/2025\/03\/IR-2-Physik-30x20.jpg 30w, https:\/\/aso-labor.de\/wp-content\/uploads\/2025\/03\/IR-2-Physik-15x10.jpg 15w\" sizes=\"auto, (max-width: 1024px) 100vw, 1024px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-eb91e36 cmsmasters-block-default cmsmasters-sticky-default elementor-widget elementor-widget-text-editor\" data-id=\"eb91e36\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t\t\t\t\t\t<h2>Discover our Capabilities<\/h2>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-841e869 cmsmasters-block-default cmsmasters-sticky-default elementor-widget elementor-widget-text-editor\" data-id=\"841e869\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t\t\t\t\t\t<h3>Electron Microscopy (SEM-EDX)<\/h3><p>The scanning electron microscope (SEM) is a device for imaging surface structures. It provides images with high resolution and depth of field.  Additionally, the distribution of various materials can be visualized. Furthermore, with the aid of Energy Dispersive X-ray Spectroscopy (EDX), the local elemental composition of the different sample areas can be analyzed. <\/p><p><strong>Applications<\/strong><\/p><ul><li>Structure and Composition of Components<\/li><li>Failure Analysis<\/li><li>Stains and Contaminants<\/li><li>Analysis of Competitor Products<\/li><\/ul>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-c422075 cmsmasters-block-default cmsmasters-sticky-default elementor-widget elementor-widget-text-editor\" data-id=\"c422075\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t\t\t\t\t\t<h3>Surface Analysis (ESCA)<\/h3><p>Electron Spectroscopy for Chemical Analysis (also XPS) analyzes (semi-quantitatively) the elemental composition of the uppermost nanometers (10-15 atomic layers) of solids.<\/p><p>The method also provides information about the bonding states of the elements. The removal of layers by sputtering allows for the measurement of the depth distribution of elements (depth profile). <\/p><p><strong>Applications<\/strong><\/p><ul><li>Adhesion<\/li><li>Wetting Problems<\/li><li>Coating Delamination<\/li><li>Surface and Interface Characterization<\/li><li>Corrosion Protection<\/li><li>Reactivity of Catalysts<\/li><\/ul>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-259148c cmsmasters-block-default cmsmasters-sticky-default elementor-widget elementor-widget-text-editor\" data-id=\"259148c\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t\t\t\t\t\t<h3>Molecular Spectroscopy (IR\/Raman\/UV-Vis)<\/h3><p>In molecular spectroscopy, absorption or scattering of incident light occurs. This is characteristic of specific molecular fragments. The recorded spectra show specific bands for certain molecular components, allowing for the identification of organic materials in particular.  <\/p><p><strong>Applications<\/strong><\/p><ul><li>Analysis of organic components<\/li><li>Polymer Characterization<\/li><li>Failure Analysis<\/li><li>Stains and Contaminants<\/li><li>Analysis of Competitor Products<\/li><\/ul>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-67c3390 cmsmasters-block-default cmsmasters-sticky-default elementor-widget elementor-widget-text-editor\" data-id=\"67c3390\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t\t\t\t\t\t<h3>Roughness Measurement (IR\/Raman\/UV-Vis)<\/h3><p>Using a profilometer, the sample surface is scanned with a stylus of defined geometry, and standardized roughness parameters are calculated.<\/p><p><strong>Applications<\/strong><\/p><ul><li>Profile<\/li><li>Waviness and Roughness<\/li><li>Mean Roughness<\/li><li>Bearing Ratio<\/li><li>Roughness Depth<\/li><\/ul>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t","protected":false},"featured_media":37304,"template":"","class_list":["post-37303","methoden","type-methoden","status-publish","has-post-thumbnail","hentry"],"_links":{"self":[{"href":"https:\/\/aso-labor.de\/en\/wp-json\/wp\/v2\/methoden\/37303","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/aso-labor.de\/en\/wp-json\/wp\/v2\/methoden"}],"about":[{"href":"https:\/\/aso-labor.de\/en\/wp-json\/wp\/v2\/types\/methoden"}],"version-history":[{"count":1,"href":"https:\/\/aso-labor.de\/en\/wp-json\/wp\/v2\/methoden\/37303\/revisions"}],"predecessor-version":[{"id":38204,"href":"https:\/\/aso-labor.de\/en\/wp-json\/wp\/v2\/methoden\/37303\/revisions\/38204"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/aso-labor.de\/en\/wp-json\/wp\/v2\/media\/37304"}],"wp:attachment":[{"href":"https:\/\/aso-labor.de\/en\/wp-json\/wp\/v2\/media?parent=37303"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}