Spectroscopy
Discover some of our methods.
NMR
(Nuclear
Magnetic
esonance)
High-resolution NMR spectroscopy is a method for the detailed structural elucidation of organic substances. The samples are placed in a strong magnetic field and irradiated with radio frequency pulses. The change in the magnetization of the elements (eg hydrogen and carbon) is observed depending on their chemical environment.
The resulting spectra provide information about functional groups, classes of compounds, relationships between individual molecular parts, structural isomerisms and even the complete structure of compounds.
application areas
applicable to all types of organic compounds including polymers
Mixtures can be quantified and impurities detected
Molecular spectroscopy (IR/Raman/
UV-Vis)
In molecular spectroscopy, the incoming light is absorbed or scattered. This is characteristic of certain molecular fragments.
The recorded spectra show specific bands for certain molecular components, which makes it particularly easy to identify organic materials.
application areas
Analysis of organic components
Polymer characterization
Damage analysis
Stains and dirt
Analysis of competitive products
X-ray fluorescence
Analysis (RFA)
The X-ray fluorescence spectrometer (XRF) provides the elemental composition of a sample and allows the detection of many elements in trace concentrations.
The method is suitable for both solid and liquid samples.
application areas
Trace analysis
Testing materials for RoHS compliance (Restriction on Hazardous Substances)
Atom-
Emissions
Spectroscopy
(ICP-OES)
ICP-OES allows the determination of elements in aqueous solutions by optical emission spectroscopy using inductively coupled plasma (argon).
Due to the high plasma temperature (10,000 K), the compounds to be analyzed in the sucked-in sample aerosols are atomized and additionally ionized. In the process, the valence electrons are raised to a higher energy level.
When returning to the ground state, the previously absorbed energy is emitted as specific light energy. The ion lines are evaluated because they are relatively insensitive to excitation disturbances. The advantages are better precision/reproducibility and detection limits. Simultaneous multi-element analysis of up to 70 elements is state of the art today.
application areas
Metal analysis
Environmental analysis
Electron
microscopy
(REM-EDX)
The scanning electron microscope (SEM) is a device for imaging surface structures. It produces images with high resolution and depth of field.
In addition, the distribution of different materials can be visualized.
Energy dispersive X-ray spectroscopy (EDX) can also be used to analyze the local elemental composition of the different sample areas.
application areas
Structure and composition of components
Damage analysis
Stains and dirt
Analysis of competitive products
Surfaces-
analytics
(ESCA)
Electron spectroscopy for chemical analysis (also XPS) analyzes (semiquantitatively) the elemental composition of the uppermost nanometers (10-15 atomic layers) of solids.
The method also provides information about the bonding states of the elements. The removal of the layers by sputtering allows the measurement of the depth distribution of elements (depth profile).
application areas
Liability
Wetting problems
Paint peeling
Surface and interface characterization
Corrosion protection
Reactivity of catalysts